Base Knowledge
Basic knowledge of electrical circuits analysis and of measurement equipment use.
Teaching Methodologies
Theoretical and Theoretical-Practical Component (A) – Expository, using audiovisual means, using an interactive and/or dialogue approach whenever possible.
In this component, each subject is presented, complemented by the resolution of small exercises to apply the knowledge acquired.
Laboratory Component (B) – Experimental, by carrying out group work in the Laboratory, applying and consolidating the topics presented in the theoretical classes.
In laboratory classes, practical work is carried out in groups aimed at the experimental validation of acquired knowledge and the implementation of
circuits designed and projected by students.
Learning Results
To learn the basic terminology of electronics, electronic devices, their characteristics and applications;
Students should acquire basic skills in DC circuit analysis and also in the design of circuits with diodes, BJTs and FETs;
To acquire skills that allow the correct use of test and measurement equipment;
To develop teamwork skills and the ability to analyze and synthesize laboratory experiments;
To have the ability to use computer simulation tools to design and simulate electronic circuits.
Program
Semiconductors
• Energy bands; mobility and conductivity.
• Intrinsic and extrinsic semiconductors. Notion of dopant, acceptors and donors. Type N and P semiconductors.
Semiconductor Diode
• The PN junction: operating principle and characteristic curves.
• Rectifier diode, Schottky, zener, LED and photo-diode and their applications.
• Limiting circuits.
• Single-phase rectifiers: half-wave and full-wave (with central point and bridge).
• Capacitive filtering and voltage regulator with zener.
Bipolar Transistors (BJT)
• Internal constitution and operating principle.
• Characteristic curves and operating regions.
• BJT’s polarization and stability of the operating point.
• Application circuits.
Field Effect Transistors (FET)
• Types of FETs: junction and MOS, their internal constitution and operation principle.
• Characteristic curves and operating regions. Polarization circuits.
• Application circuits.
Curricular Unit Teachers
Marco José da SilvaGrading Methods
Assessment model applied: Continuous and Periodic Assessment.
Students cannot have more than two absences in laboratory classes.
For students under special regims, namely those under the Worker-Student Statute, an agreement must be reached between the UC coordinator and the student regarding the functioning of the laboratory component when the student is unable to attend during the scheduled hours.
Access to the Exam necessarily presupposes that the student has obtained a minimum grade in the laboratory component according to the following assessment rules:
Theoretical Component - Theoretical Assessment Tests (9 points) (A1):
Two assessment Tests, one in the middle and one at the end of the academic term (minimum of 40% for approval (weighted average)), and/or,
final exam, with two parts equivalent to the continuous assessment Tests, accessible to all students who obtain approval in the laboratory component.
This exam can be taken in the exam periods following the academic term if the theoretical continuous assessment tests aproval is not obtained.
Students may choose to take only one of the parts if they have obtained a minimum grade in the other part (minimum of 40%).
Theoretical Component – Questionnaires to be answered at moodle.isec.pt (1 point) (A2):
Essay questions of a theoretical-practical nature that will be open to all students, including those already attending classes.
Laboratory Component (B) – Preparation and execution of practical work with recording of the analysis of results on the Moodle platform and an individual laboratory test – 10 values (40% minimum).
Final Grade for the Course = A1(0...9) + A2(0...1) + B(0…10)
Internship(s)
NAO
Bibliography
Slides used in theoretical classes, made available via ISEC web platforms.
Practice sheets containing exercises on the subject taught.
Boylestad, R. L., & Nashelsky, L. (2004). Dispositivos eletrônicos e teoria de circuitos (8ª ed., reimpressão). Pearson/Prentice Hall. 1-1-269 (ISEC) – 15190
Malvino, A. P. (2000). Princípios de electrónica (Vols. 1–2, 6ª ed.). McGraw-Hill. 1-1-256/2571-1-258/2591-1-307/3081-1-309/310 (ISEC) (ISEC) (ISEC) (ISEC)
Malvino, A., & Bates, D. (2015). Electronic principles (8th ed.). McGraw-Hill Education.