Base Knowledge
Skills in electrical circuits analysis and in basic use of measurement equipment.
Teaching Methodologies
Expository in theoretical classes, using audiovisual media, using an interactive and/or dialogue approach whenever possible.
In theoretical-practical classes, small exercises are carried out to apply the knowledge acquired, which are subsequently tried out in laboratory classes.
Experimental, with individual or group work carried out, applying and consolidating the topics studied.
Learning Results
To understand the fundamental functioning and know the main characteristics of semiconductor devices (diodes, bipolar junction transistor and field-effect).
To know and know how to analyze fundamental electronic circuits. Know and correctly use test and measurement equipment for experimentation and troubleshooting.
To develop the ability to perform group work, analyze and synthesize laboratory experiences and write technical reports.
Program
1. Analog electronics and measurement equipment fundamentals.
2. Semiconductor operation theory:
– Diodes, Transistors (BJT and FET).
3. Electronic circuits:
a) Diode rectifier circuits;
b) Capacitive filtering and stabilization with zener diode;
c) Polarization and switching circuits with transistors;
d) Basic arithmetic circuits with Operational Amplifier;
4. Design of electronic circuits:
a) Electronic schematics and PCB boards;
b) Soldering of electronic components.
Curricular Unit Teachers
Marco José da SilvaGrading Methods
Applied Assessment Model: Continuous and Periodic Assessment
The conditions for accessing exam, obtaining and waiving attendance, as well as the rules for improving classification, are described in the CTeSP regulations.
The assessment of the Curricular Unit is made up of the following components:
Theoretical-practical component (A) – Rated for 8 values (minimum of 40% for approval).
Two assessment tests, one in the middle and one at the end of the academic period. Approval requires a minimum weighted average of 40% across both tests.
And/or:
Final exam, consisting of two parts equivalent to continuous assessment tests, accessible to all students who pass the laboratory component.
This exam can be taken in exam periods following the class period, if the student does not pass the continuous assessment theoretical-practical tests.
Students can choose to take only one part of the exam, as long as they have reached the minimum score in the other (minimum 40% for approval).
Laboratory Component (B) – Quoted for 12 values (minimum of 50% for approval):
Carrying out practical work with written reports and carrying out a small individual laboratory test.
The final grade will be calculated as follows:
Final Grade = A (0...8) + B (0...12)
Internship(s)
NAO
Bibliography
Slides used in theoretical classes, theoretical-practical and laboratory work sheets, made available via ISEC web platforms.
Boylestad, R. L., & Nashelsky, L. (2004). Dispositivos eletrônicos e teoria de circuitos (8ª ed.). Pearson/Prentice Hall.
Copies available at the ISEC Library: 1-1-269 (ISEC) – 15190
Malvino, A. P. (2000). Princípios de electrónica (Vols. 1–2, 6ª ed.). McGraw-Hill.
Copies available at the ISEC Library: 1-1-256/2571-1-258/2591-1-307/3081-1-309/310 (ISEC)