Teaching Methodologies
– The teaching approach combines lectures with practical examples drawn from current metrology applications.
– Peer-based learning is encouraged through the presentation and discussion of student projects during class.
– The learning experience is enhanced by invited lectures from external experts and study visits to metrology or calibration laboratories, fostering a strong connection between academic learning and professional practice.
Learning Results
1 Understand and apply physical quantities and measurement units.
2 Analyse and explain the fundamental concepts related to measurement.
3 Critically assess statistical data, measurement errors, and uncertainty.
4 Identify and classify the different types of metrology.
5 Design and implement metrological control processes for measuring instruments.
6 Define the requirements for establishing and managing a metrology laboratory.
Program
1. Introduction to Metrology
– Historical overview
– Role and applications of metrology
– Types of metrology: scientific, applied, and legal
– International System of Units (SI)
– National and international metrological structure
2. International Vocabulary of Metrology (VIM)
– Quantities and units
– Measurement
– Measuring instruments
– Properties of measuring instruments
– Measurement standards
3. Metrology Laboratories
– National Metrology Laboratory
– Calibration and testing laboratories
– Bodies for Metrological Verification
4. Measurement Uncertainty
– Types and sources of error
– Categories and quantification of uncertainty sources
– Guide to the Expression of Uncertainty in Measurement (GUM)
5. Calibration Laboratories and Metrological Quality
– Requirements and accreditation
– Quality management systems
– Interpretation of calibration certificates
Curricular Unit Teachers
Fernanda Madureira CoutinhoGrading Methods
- - Individual and/or Group Work - 50.0%
- - Exam - 50.0%
Internship(s)
NAO
Bibliography
– Bucher, J. L. (Ed.). (2015). The metrology handbook (2nd ed.). ASQ Measurement Quality Division.
– Crowder, S., Coleman, W., Kacker, R., & Liu, H. (2020). Introduction to statistics in metrology. Springer.
– Taylor, J. R. (1997). An introduction to error analysis: The study of uncertainties in physical measurements (2nd ed.). University Science Books.
– Joint Committee for Guides in Metrology. (2008). International vocabulary of metrology-Basic and general concepts and associated terms (VIM). JCGM 200:2008.
– International Organization for Standardization. (2005). ISO/IEC 17025:2005 – General requirements for the competence of testing and calibration laboratories.
– International Organization for Standardization. (2003). ISO 10012:2003 – Measurement management systems: Requirements for measurement processes and measuring equipment.