Metrologia

Physics and Mathematics with emphasis on Statistical Methods.

• The expository method is used, enriched with current examples of application of the various topics covered.
• The peer-based learning approach is encouraged through the presentation and discussion of work done by students in the classroom context.
• The learning process is enriched with lectures given throughout the semester by external experts and also by conducting study visits.

1. Understand and apply physical quantities and measurement units.
2. Analyze and explain the fundamental concepts associated with the act of measurement.
3. Critically evaluate statistical data of measurements, errors, and uncertainties of measurement errors.
4. Examine and classify the different types of metrology.
5. Structure and implement the process of metrological control of measuring equipment.
6. Define the requirements for designing a metrology laboratory.

1. Metrology

• History
• Concepts
• Precision vs. Accuracy vs. Veracity
• Calibration vs. Verification vs. Adjustment vs. Testing
• Pattern
• Traceability

2. Analysis of errors

• Fundamental concepts of statistics
• Measurement error
• Type of errors
• Measurement uncertainty
• Types of uncertainty
• Identification and modelling of sources of uncertainty
• Propagation of uncertainty
• Results presentation

3. Calibration and test procedure

• Characterization of the equipment to be calibrated
• Pattern
• Protocols
• Manual, semi-autonomous and autonomous calibration
• Programming languages ​​for calibration processes
• Physical Interfaces
• Criterion of Acceptance
• Calibration and test certificates

4. Laboratory calibration

• Organization of a calibration laboratory and tests
• Control of environmental conditions
• Materials control data bases
• Logistics chain
• Quality management system
• Standards (IEEE, DIN, AFMETCAL, etc.), (ISO 9001, ISO 10012, ISO / IEC 17025)
• Accreditation of a calibration laboratory

NAO

• Bucher, J. L. (Ed.), (2015). The metrology handbook. 2nd edition. ASQ Measurement Quality Division. 
• Crowder, S. et al., (2020). Introduction to Statistics in Metrology. Springer.
• Taylor, J., (1997) Introduction to error analysis, the study of uncertainties in physical measurements.
• Joint Committee for Guides in Metrology, (2008). International vocabulary of metrology—Basic and general concepts and associated terms (VIM).
• ISO (2005, May). ISO/IEC 17025: 2005 General requirements for the competence of testing and calibration laboratories. 
• ISO (2003, April). ISO 10012:2003 Measurement management systems — Requirements for measurement processes and measuring equipment.